@article {11573/1328571,
	title = {{Organic solar cells defects detection by means of an elliptical basis neural network and a new feature extraction technique}},
	journal = {OPTIK},
	volume = {{194}},
	number = {{False}},
	year = {2019},
	pages = {False-False},
	keywords = {Elliptical basis neural network (EBNN), Feature extraction procedure, Gray level co-occurrence matrix (GLCM), Organic solar cells (OSCs), Singular value decomposition (SVD)}, {Atomic force microscope (AFM)},
	doi = {{10.1016/j.ijleo.2019.163038}},
	author = {Lo Sciuto, Grazia and Napoli, Christian and Capizzi, Giacomo and Shikler, Rafi}
}
